کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
78435 | 49331 | 2013 | 6 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Study of CdTe/CdS heterostructure by CdCl2 heat treatment via in situ high temperature XRD Study of CdTe/CdS heterostructure by CdCl2 heat treatment via in situ high temperature XRD](/preview/png/78435.png)
A CdTe/CdS heterostructure was fabricated on Fluorine Tin Oxide glass to produce thin-film photovoltaic devices. A CdCl2 layer was deposited onto the CdTe absorber layer and the subsequent annealing of the stack was performed in a He atmosphere. The influence of the CdCl2-activation step on the interfaces was investigated by monitoring the phase transition of CdCl2-heat-treated CdTe specimens during temperature ramp annealing via in situ high-temperature X-ray diffraction. X-ray Photoelectron Spectroscopy depth profiling data confirmed the interdiffusion between the CdTe and CdS layers through observation of the binding energy shifts and atomic ratio. The experimental results reveal that a compressive force, which is due to the formation of CdTeCdCl2 eutectic liquid phases between grains, which cause the capillary action of such liquid phases, seems to introduce a compressive strain in the plane of the film that facilitates the recrystallization process.
► CdTe/CdS heterostructure fabricated to form thin-film photovoltaic devices.
► CdCl2 layer was deposited to observe heat treatment mechanism.
► Via in situ HT-XRD various interesting results were detected.
► XPS depth profiling reveals the inter-diffusion between CdTe and CdS layers.
Journal: Solar Energy Materials and Solar Cells - Volume 109, February 2013, Pages 209–214