Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing

Synchrotron high energy X-ray diffraction study of microstructure evolution of severely cold drawn NiTi wire during annealing

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 115, 15 August 2016, Pages 35-44

Cun Yu, Bachir Aoun, Lishan Cui, Yinong Liu, Hong Yang, Xiaohua Jiang, Song Cai, Daqiang Jiang, Zunping Liu, Dennis E. Brown, Yang Ren,