Interdiffusion in epitaxial, single-crystalline Au/Ag thin films studied by Auger electron spectroscopy sputter-depth profiling and positron annihilation

Interdiffusion in epitaxial, single-crystalline Au/Ag thin films studied by Auger electron spectroscopy sputter-depth profiling and positron annihilation

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 107, 1 April 2016, Pages 133-143

Martin A. Noah, David Flötotto, Zumin Wang, Markus Reiner, Christoph Hugenschmidt, Eric J. Mittemeijer,