Lifetime prediction and reliability estimation methodology for Stirling-type pulse tube refrigerators by gaseous contamination accelerated degradation testing

Lifetime and reliability are the two performance parameters of premium importance for modern space Stirling-type pulse tube refrigerators (SPTRs), which are required to operate in excess of 10 years. Demonstration of these parameters provides a significant challenge. This paper proposes a lifetime prediction and reliability estimation method that utilizes accelerated degradation testing (ADT) for SPTRs related to gaseous contamination failure. The method was experimentally validated via three groups of gaseous contamination ADT. First, the performance degradation model based on mechanism of contamination failure and material outgassing characteristics of SPTRs was established. Next, a preliminary test was performed to determine whether the mechanism of contamination failure of the SPTRs during ADT is consistent with normal life testing. Subsequently, the experimental program of ADT was designed for SPTRs. Then, three groups of gaseous contamination ADT were performed at elevated ambient temperatures of 40 °C, 50 °C, and 60 °C, respectively and the estimated lifetimes of the SPTRs under normal condition were obtained through acceleration model (Arrhenius model). The results show good fitting of the degradation model with the experimental data. Finally, we obtained the reliability estimation of SPTRs through using the Weibull distribution. The proposed novel methodology enables us to take less than one year time to estimate the reliability of the SPTRs designed for more than 10 years.