Determination of neutron scattering potential of the thin multilayered film with gadolinium reference layer

This paper describes a method for scattering potential determination using the experimental data of polarized neutron reflectometry. The samples under consideration are the multilayered metallic thin films with complicated chemical and magnetic structures. The sample must have a gadolinium reference layer at the top. Three reflective curves with different wavelengths of the primary beam give a possibility to reconstruct the modulus and the phase of the reflection coefficient for investigated part of the sample. Then one can calculate the scattering potential via the solution of Gelfand-Levitan-Marchenko equation. The numerical simulations for different systems demonstrate, that potential is determined with the accuracy, sufficient to analyze the structure of the investigated sample.