کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
79651 | 49362 | 2011 | 5 صفحه PDF | دانلود رایگان |
The light trapping characteristics in the wavelength range of 0.5−1.2 μm for the random back-reflective silicon film with omnidirectional top anti-reflection are numerically analyzed based on the simplified probability method. The spectrum averaged maximum external quantum efficiency (EQE) for the 5 μm thick silicon film is evaluated with an increase of 10.6% compared with the best bulk planar silicon solar cell—suggesting that an efficiency higher than those of the best bulk planar cell can be obtained for thin film silicon solar cells several microns thick. The light absorption curves drop slowly with increased back absorption, exhibiting that the performance of the thin film silicon solar cell with light trapping is tolerant of back absorption.
Figure optionsDownload as PowerPoint slideHighlights
► Simulate light trapping in semi-random reflective thin silicon solar cell.
► The maximum absorption is calculated by a special mathematical technique.
► Results show that the thin cell is tolerant of back absorption.
► Results serve as a reference for solar cell designers.
Journal: Solar Energy Materials and Solar Cells - Volume 95, Issue 12, December 2011, Pages 3455–3459