کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
80260 | 49380 | 2010 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Variogram analysis of charge-carrier effective lifetime topograms in mc-Si materials
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی شیمی
کاتالیزور
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Variogram analysis of charge-carrier effective lifetime topograms in mc-Si materials Variogram analysis of charge-carrier effective lifetime topograms in mc-Si materials](/preview/png/80260.png)
چکیده انگلیسی
All relevant physical properties of semiconductors show spatial fluctuations. It is possible to analyze this spatial variation statistically using variogam analysis. The present paper gives a first example for the application of this method, for the case of charge-carrier effective lifetime, which was measured with the microwave-detected photoconductivity (MDP) system.It can be shown that different types of spatial distribution of defects in wafers are well-characterized by different variograms. Furthermore, there exist different spatial correlation ranges and variances of charge-carrier effective lifetime in wafers from different height positions in a brick.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Solar Energy Materials and Solar Cells - Volume 94, Issue 2, February 2010, Pages 164–170
Journal: Solar Energy Materials and Solar Cells - Volume 94, Issue 2, February 2010, Pages 164–170
نویسندگان
Kathrin Niemietz, Anett Wagner, B. Gründig-Wendrock, Dietrich Stoyan, Jürgen R. Niklas,