کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
9829765 | 1524498 | 2005 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Real-time X-ray study of roughness scaling in the initial growth of epitaxial BaTiO3/LaNiO3 superlattices
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The evolution of surface and interface roughness during heteroepitaxial growth of strained BaTiO3/LaNiO3(BTO/LNO) superlattices on SrTiO3 (0Â 0Â 1) substrates was investigated using real-time X-ray reflectivity measurements in situ with synchrotron radiation. The roughness scaling of the growth front and interface of superlattices with modulation length below (2 and 6Â nm) and beyond (20Â nm) the critical thickness was studied against the bilayer number. The fitted results of in situ specular X-ray reflectivity curves reveal a two-dimensional growth of BTO and LNO sublayers on the SrTiO3 substrate for superlattices with a modulation length below the critical thickness. Moreover, a larger root-mean-square roughness of BTO/LNO interface was obtained in the superlattice with modulation length beyond the critical thickness indicating lattice relaxation in the superlattice structure. Fitted results of in situ specular X-ray reflectivity curves provide the first evidence for power-law scaling of the root-mean-square roughness of an interface and a surface in the superlattice structure. Observation of such a roughness scaling behavior indicates that strain plays an important role in the determination of microstructure in the growth of epitaxial BTO/LNO superlattices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Crystal Growth - Volume 279, Issues 1â2, 15 May 2005, Pages 114-121
Journal: Journal of Crystal Growth - Volume 279, Issues 1â2, 15 May 2005, Pages 114-121
نویسندگان
Yuan-Chang Liang, Hsin-Yi Lee, Heng-Jui Liu, Chun-Kai Huang, Tai-Bor Wu,