Keywords: 07.78 + ثانیه; 41.85.âp; 41.75.Ak; 07.78.+s; 29.30.Kv; Nuclear microprobe; Alignment; Grid shadow; Performance;
مقالات ISI 07.78 + ثانیه (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Thermoluminescence studies of solution combustion synthesized Y2O3:Nd3+ nanophosphor
Keywords: 07.78 + ثانیه; 79.60.Jv; 07.78.+S; 77.84.Bw; 78.47.jd; Nanostructures; Electron microscopy; Oxides; Luminescence;
Secondary electron emission and charging mechanisms in Auger Electron Spectroscopy and related e-beam techniques
Keywords: 07.78 + ثانیه; 79.20Fv; 79.20Hx; 61.82Ms; 61.16Bg; 07.78.+s; Surface analysis; Auger Electron Spectroscopy; Insulating materials; SEM; Secondary electron emission;
Core level photoelectron spectromicroscopy with Al Kα1 excitation at 500 nm spatial resolution
Keywords: 07.78 + ثانیه; 79.60.âI; 07.78.+s; XPS imaging; Core level; XPEEM; Resolution;
Electron beam confinement and image contrast enhancement in near field emission scanning electron microscopy
Keywords: 07.78 + ثانیه; 07.78.+s; 68.37.Vj; 68.37.Ef; 07.79.FcField emission; SEM; STM
Time Resolved Ion Beam Induced Current measurements on MOS capacitors using a cyclotron microbeam
Keywords: 07.78 + ثانیه; 07.78.+s; 29.20.Dg; 61.80.−x; 72.20.Jv; 85.30.TvCyclotron; TRIBIC; MOS capacitor; Nuclear microprobe
Performance of the Sumy nuclear microprobe with the integrated probe-forming system
Keywords: 07.78 + ثانیه; 07.78.+s; 41.85.Lc; 41.85.−pNuclear microprobe; Data acquisition system; Beam optics
Preparation of carbon-free TEM microgrids by metal sputtering
Keywords: 07.78 + ثانیه; 07.78.+s; Preparation; TEM; Microgrids; Sputtering;
Zirconium oxidation on the atomic scale
Keywords: 07.78 + ثانیه; 07.78.+s; 81.05.Bx; 81.65.Mq; 82.20.−w3D atom probe analysis; Field ion microscopy; Zirconium; Sub-oxide
Initial experimental results on a magnetic beam separator spectrometer for the SEM
Keywords: 07.78 + ثانیه; 07.78.+s; 68.37.Hk; 82.80.Pv; Magnetic beam separator; Scanning electron microscopy; Electron spectroscopy;
Upgrading of the 4.5 MV Dynamitron accelerator at Tohoku University for microbeam and nanobeam applications
Keywords: 07.78 + ثانیه; 07.78.+s; 41.75.−I; 41.85.LcNanobeam; Microbeam; Brightness; Upgrade
Optimization of the working distance of an ion microprobe-forming system
Keywords: 07.78 + ثانیه; 41.85.âp; 41.85.Lc; 07.78.+s; Working distance; Quadrupole lens; Optimization; Resolution improvement;
Proton beam writing and electroplating for the fabrication of high aspect ratio Au microstructures
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.PqProton beam writing; High aspect ratio; Electroplating; Au microstructure
Enhanced imaging in low dose electron microscopy using electron counting
Keywords: 07.78 + ثانیه; DQE; MTF; CMOS; Electron counting; 07.78.+s; 85.60.Gz; 87.64.Ee;
Fabrication of microstructures in III–V semiconductors by proton beam writing
Keywords: 07.78 + ثانیه; 07.78.+s; 81.16.−c; 81.05.Ea; 61.80.JhProton beam writing; InP; GaAs; Electrochemical etching
Tomographic spectroscopic imaging; an experimental proof of concept
Keywords: 07.78 + ثانیه; 07.05.Pj; 07.78.+s; 42.15.−i; 42.30.WbTomography; EELS; EFTEM; Data cube
A model of secondary electron imaging in the helium ion scanning microscope
Keywords: 07.78 + ثانیه; 07.78.+s; 41.75.Ak; 79.20.HxSecondary electrons; Helium ions; Scanning microscopy
Electron microscope imaging of single particles using the Medipix2 detector
Keywords: 07.78 + ثانیه; 85.60.G; 07.78.+s; 87.64.Ee; Hybrid pixel detectors; Imaging detectors; Electron microscopy;
High-momentum analysis in Doppler spectroscopy
Keywords: 07.78 + ثانیه; 78.70.Bj; 71.60.+z; 02.60.Ed; 07.05.Kf; 07.78.+s; Doppler spectroscopy; Ge-detector; PAS; Electron momentum;
The ionoluminescence apparatus at the LABEC external microbeam facility
Keywords: 07.78 + ثانیه; 78.60.Hk; 78.70.En; 07.78.+s; 07.79.−vPIXE; Ionoluminescence; Lapis lazuli; External microbeam
Retrieving the complex degree of spatial coherence of electron beams
Keywords: 07.78 + ثانیه; 07.60.Ly; 07.78.+s; 41.75.Fr; 42.25.Kb
A coherence approach to phase-contrast microscopy: Theory
Keywords: 07.78 + ثانیه; 07.78.+s; 42.25.Kb; 42.30.Rx; 42.30.−d; 07.85.TtPhase retrieval; Transmission electron microscopy; Partial coherence; Contrast transfer; X-ray microscopy
Energy-filtered electron backscatter diffraction
Keywords: 07.78 + ثانیه; 61.14.−x; 07.78.+s; 34.50.BwElectron backscatter diffraction (EBSD); Energy filter; Kikuchi bands
Real-time imaging of surface evolution driven by variable-energy ion irradiation
Keywords: 07.78 + ثانیه; 61.80.−x; 07.77.Ka; 07.78.+s; 79.20.RfLow-energy electron microscopy; Irradiation; Ion source; Sputtering
Quantification of small, convex particles by TEM
Keywords: 07.78 + ثانیه; 07.78.+s; 02.70.Rr; 81.05.−Bx; 06.20.−fParticle quantification; Size distribution; TEM; Schwartz–Saltykov method
Seeing atoms with aberration-corrected sub-Ångström electron microscopy
Keywords: 07.78 + ثانیه; 07.78.+s; 61.14.DcHRTEM; Contrast transfer theory; Sub-Ångström resolution; Aberration correction
Imaging of radiation-sensitive samples in transmission electron microscopes equipped with Zernike phase plates
Keywords: 07.78 + ثانیه; 41.90.+e; 07.78.+s; 61.16.Bg; 61.80.−xZernike phase plate; Boersch lens; Radiation damage; Transmission electron microscope; Spherical aberration; High-resolution TEM; Biological TEM; Single molecule TEM; Low-voltage TEM
An electron microscope for the aberration-corrected era
Keywords: 07.78 + ثانیه; 07.78.+s; 42.15.Fr; 41.85.−p; 68.37.Hk; 06.60.SxAberration correction; STEM design; Sample stage; HAADF imaging; EELS
The scientific contributions of Karl Frederick Canter (1944-2006)
Keywords: 07.78 + ثانیه; 01.60.+q; 34.85.+x; 79.20.Mb; 07.78.+s; 41.85.-p; Karl Canter; In memoriam; Positron beams; Positron localization; Magnetotactic bacteria;
Investigation of synthetic cylindrite-microstructures
Keywords: 07.78 + ثانیه; 07.78.+s; 29.30.Kv; 91.60.Ed; Cylindrite; μRBS; μPIXE; Microstructures;
Poly (dimethyl siloxane) micro/nanostructure replication using proton beam written masters
Keywords: 07.78 + ثانیه; 07.10.Cm; 07.78.+s; 85.40.HpProton beam writing; PDMS casting; Replication
New resists for proton beam writing
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.PqProton beam writing; Direct write; High aspect ratio; Resist
Hydrogen silsesquioxane a next generation resist for proton beam writing at the 20 nm level
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.PqProton beam writing; Direct write; High aspect ratio
Rapid prototyping of micro/nano poly (methyl methacrylate) fluidic systems using proton beam writing
Keywords: 07.78 + ثانیه; 07.78.+s; 85.85.+jProton beam writing; PMMA nano enclosed channels; Fluidic chips
High aspect ratio PDMS replication through proton beam fabricated Ni masters
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.Pq; 07.10.Cm; 87.64.−t; 87.22.−qProton beam writing; Ni stamps; High aspect ratio; Soft lithography; PDMS
High resolution quantitative element mapping of neuromelanin-containing neurons
Keywords: 07.78 + ثانیه; 87.64.ât; 82.80.Yc; 41.75.Ak; 07.78.+s; Neuromelanin; Iron; Quantitative analysis; Submicron resolution;
A study of the anomalous field evaporation of Sm(Co0.68Fe0.20Cu0.10Zr0.02)7.5 alloy by 3D atom probe
Keywords: 07.78 + ثانیه; 07.78.+s; 79.70.+q; 75.50.Ww; Atom probe; Preferential evaporation; SmCo permanent magnets;
Sidewall quality in proton beam writing
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.PqProton beam writing; Cross sectional resist roughness; PMMA
Nuclear microprobe investigation into the trace elemental contents of carotid artery walls of apolipoprotein E deficient mice
Keywords: 07.78 + ثانیه; 07.78.+s; 87.64.ât; 91.65.Nd; 95.85.Nv; 76.40.+b; Atherosclerosis; Carotid artery; Apolipoprotein Eâ/â mice; Probucol; Iron; Zinc; Nuclear microscopy; Free radicals;
Fabrication of free standing resolution standards using proton beam writing
Keywords: 07.78 + ثانیه; 07.78.+s; 85.40.Hp; 81.16.Nd; 81.15.Pq; Proton beam writing; Resolution standards; Ni grid; DUV;
EBIC and IBIC Imaging on Polycrystalline CdTe
Keywords: 07.78 + ثانیه; 07.78.+s; 29.40.Wk; 72.20.Jv; 72.40.+w; 72.80.Ey; 73.61.Ga; 78.66.HfPolycrystalline CdTe; EBIC; IBIC; Grain boundaries; Carriers mobility; Carriers lifetime
Intracellular iron concentration of neurons with and without perineuronal nets
Keywords: 07.78 + ثانیه; 07.78.+s; 82.80.Ej; 87.16.−b; 87.17.Nn; 87.19.La; 87.64.GbIron; Neuron; Perineuronal net; PIXE
Exploratory nuclear microprobe data visualisation using 3- and 4-dimensional biological volume rendering tools
Keywords: 07.78 + ثانیه; 68.37.−d; 87.59.−e; 07.78.+s; 42.30.VaNanobeam; Bio-imaging; Microbeam; PIXE; STIM; Volume rendering; Cells; Organelles
Electron irradiation-induced destruction of carbon nanotubes in electron microscopes
Keywords: 07.78 + ثانیه; 73.61.Wp; 07.78.+s; 85.35.−pMulti-wall carbon nanotube; TEM; SEM; Electron irradiation; Electron beam-induced reaction
Two-colour laser excitation as a way to set an absolute energy scale in photodetachment-microscopy based electron spectrometry
Keywords: 07.78 + ثانیه; 03.75.âb; 06.30.Ft; 07.78.+s; 32.10.Hq; 32.80.Gc; 42.60.Fc; Photodetachment; Electron interference; Electron affinity; Laser beam modulation;
Proton beam writing of submicrometer structures at LIPSION
Keywords: 07.78 + ثانیه; 07.78.+s; 81.15.Pq; 81.16.−c; 61.82.Pv; 81.05.CyProton beam writing; Photo resist; Ni-plating; Silicon; Electrochemical etching
Inexpensive two-tip nanomanipulator for a SEM
Keywords: 07.78 + ثانیه; 85.40.Ux; 06.60.Sx; 07.78.+s; 85.30.Vw; 81.05.Ys; Nanomanipulator; Scanning electron microscope (SEM); Nanomanipulation; Nanowires;
Prospects for aberration corrected electron precession
Keywords: 07.78 + ثانیه; 07.78.+s; 61.14.Dc; 61.14.LjAberration correction; Electron diffraction; Precession
Progress and application of the Tohoku microbeam system
Keywords: 07.78 + ثانیه; 07.78.+s; 41.75.−i; 41.85.LcMicrobeam; Parasitic field contamination; Grid shadow method; HMI; PIXE; RBS; STIM; 3D μ-CT
Bright-field TEM imaging of single molecules: Dream or near future?
Keywords: 07.78 + ثانیه; 41.90.+e; 07.78.+s; 61.16.Bg; 61.80.−xSpherical aberration; Radiation damage; Bright-field TEM; High-resolution TEM; Single molecule imaging; Low-dose imaging; Field-emission source