دانلود مقالات ISI درباره 77.55 + ترجمه فارسی

Characterization and optimization of porogen-based PECVD deposited extreme low-k materials as a function of UV-cure time

Keywords: 77.55; 52.75R; 81.05R; 78.20C; 81.40TPECVD; Low-k material; Porogen; UV cure

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2007 سفارش ترجمه

MOCVD and characterization of Hf-silicate thin films using HTB and TEMAS

Keywords: 84.37; 52.75.R; 81.15.G; 77.55; 68.55.L; 77.84.BThin film transistors; Chemical vapor deposition; Silicates; X-ray diffraction

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2007 سفارش ترجمه

Rare-earth-doped GVO films grown by pulsed laser deposition

Keywords: 81.15.F; 78.66; 77.55; 61.10.N; Pulsed laser deposition; Thin film; GdVO4; XRD; Spectroscopy;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2006 سفارش ترجمه

Room temperature plasma oxidation: A new process for preparation of ultrathin layers of silicon oxide, and high dielectric constant materials

Keywords: 77.55; 77.84; 73.50.MPlasma oxidation; Dielectric films; Silicon oxide; Metal-Oxide-Semiconductor structures

دانلود رایگان متن کامل مقاله ISI 9 صفحه سال انتشار : 2006 سفارش ترجمه

Effects of plasma treatments on structural and electrical properties of methyl-doped silicon oxide low dielectric constant film

Keywords: 77.55; 52.75.R; 68.55.JLow k dielectric film; Plasma treatment; Structural properties; Electrical performance

دانلود رایگان متن کامل مقاله ISI 10 صفحه سال انتشار : 2006 سفارش ترجمه

Influence of carrier gas pressure and flow rate on atomic layer deposition of HfO2 and ZrO2 thin films

Keywords: 68.55; 77.55; 78.65; Hafnium dioxide; Zirconium dioxide; Atomic layer deposition; Surface reactions; Crystal structure; Optical properties;

دانلود رایگان متن کامل مقاله ISI 12 صفحه سال انتشار : 2006 سفارش ترجمه

Oxygen to silicon ratio determination of SiOxHy thin films

Keywords: 77.55; 52.75.R; Silicon oxide; Cyclotron resonance; Fourier transform infrared spectroscopy;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2005 سفارش ترجمه

Correlations between grain size and nonlinear dielectric properties of as-deposited SrTiO3 thin films

Keywords: 77.55; Atomic force microscopy (AFM); Dielectric properties; Grain boundary; Growth mechanism; Ferroelectric materials; Pulse laser deposition; X-ray diffraction;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2005 سفارش ترجمه

a-Si/SiOx Bragg-reflectors on micro-structured InP

Keywords: 42.79.D; 07.60.F; 07.60.H; 07.60.P; 42.55.S; 77.55; Bragg mirror; Silicon oxide; Optical coatings; Ellipsometry; Curved micro structure;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2005 سفارش ترجمه

Fabrication of high performance pentacene thin film transistors using poly(4-vinylphenol) as the gate insulator on polyethyleneterephthalate substrates

Keywords: 72.80.L; 85.70K; 77.55; Dielectrics; Electrical properties and measurements; Electronic devices; Organic semiconductors; OTFT; organic insulator; PVP; PET;

دانلود رایگان متن کامل مقاله ISI 4 صفحه سال انتشار : 2005 سفارش ترجمه

Mechanical stress in ALD-Al2O3 films

Keywords: 77.55; 68.55; 68.60; 07.10.L; Dielectric thin films; Atomic-layer deposition; Temperature dependence of mechanical stress; Phase transition; Stress relaxation;

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2005 سفارش ترجمه

Effect of multi-coating process on the orientation and microstructure of lead zirconate titanate (PZT) thin films derived by chemical solution deposition

Keywords: 81.15; 77.55; 81.20.K; Lead zirconate titanate; Chemical deposition; X-ray diffraction; Ferroelectric properties;

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2005 سفارش ترجمه

Effects of deposition temperature on the structure and thermal stability of a-C:F films with low dielectric constant

Keywords: 77.55; 81.15; 68.60D; Dielectric film; Deposition temperature; Thermal stability;

دانلود رایگان متن کامل مقاله ISI 5 صفحه سال انتشار : 2005 سفارش ترجمه

Pulsed laser deposition of HfO2 and PrxOy high-k films on Si(100)

Keywords: 77.55; 81.15.Fg; High-k gate dielectric material; Praseodymium oxide; Hafnium oxide; Pulsed laser deposition;

دانلود رایگان متن کامل مقاله ISI 6 صفحه سال انتشار : 2005 سفارش ترجمه

Effects of oxygen flow rate on the properties of HfO2 layers grown by metalorganic molecular beam epitaxy

Keywords: 81.15.H; 77.55; 77.84.B; Metalorganic molecular beam epitaxy; Oxides; Dielectric materials;

دانلود رایگان متن کامل مقاله ISI 7 صفحه سال انتشار : 2005 سفارش ترجمه

Diamond-like carbon as a buffer layer in polymeric electroluminescent device

Keywords: 77.55; Sputtering; Electroluminescent devices; Polymers; Buffer layer; PLED; Diamond like carbon;

دانلود رایگان متن کامل مقاله ISI 7 صفحه سال انتشار : 2005 سفارش ترجمه

Characterization of spray deposited bismuth oxide thin films and their thermal conversion to bismuth silicate

Keywords: 73.61.N; 77.55; 82.30.L; 77.84.B; Synthesis; Characterization; Insulators; Dielectric properties; Pyrolysis; Oxides;

دانلود رایگان متن کامل مقاله ISI 7 صفحه سال انتشار : 2005 سفارش ترجمه

Effects of oxygen pressure on lattice parameter, orientation, surface morphology and deposition rate of (Ba0.02Sr0.98)TiO3 thin films grown on MgO substrate by pulsed laser deposition

Keywords: 77.55; 68.55; Oxygen pressure; Pulsed laser deposition; BST thin film; Structural characterization;

دانلود رایگان متن کامل مقاله ISI 8 صفحه سال انتشار : 2005 سفارش ترجمه

Glassy and nanocrystalline photonic materials and structures by sol-gel

Keywords: 42.70.Q; 81.20.F; 77.55; Sol-gel; Planar waveguides; Erbium doping; Photonic bandgap structures; Fabry-Perot microcavities; Antenna effect;

دانلود رایگان متن کامل مقاله ISI 8 صفحه سال انتشار : 2005 سفارش ترجمه

Li-doping effects on the electrical properties of ZnO films prepared by the chemical-bath deposition method

Keywords: 73.30.+y; 73.50.−h; 77.55; Zink oxide films; Chemical bath deposition; Electrical properties and measurements; Dielectric properties;

دانلود رایگان متن کامل مقاله ISI 10 صفحه سال انتشار : 2005 سفارش ترجمه