Effects of surface non-stoichiometry on the electronic structure of ultrathin NiO(0Â 0Â 1) film
Keywords: 78.40.-q; 61.05.jh; 79.60.Jv; 61.72.jd; 78.40.âq; 79.60.Bm; Oxide ultrathin film; Oxygen vacancy defect; Angle resolved photoemission spectroscopy; X-ray photoemission spectroscopy; Low energy electron diffraction;