
The investigation of current-conduction mechanisms (CCMs) in Au/ (0.07Zn-PVA)/n-4H-SiC (MPS) Schottky diodes (SDs) by using (I-V-T) measurements
Keywords: عدم انحرافات مانع; Au/(Zn-PVA)/n-4H-SiC (MPS) type Schottky diodes; Possible current-conduction mechanism; Barrier inhomogeneities; Double Gaussian distribution (DGD) of barrier height;