
Characterisation of nanovoiding in dental porcelain using small angle neutron scattering and transmission electron microscopy
Keywords: بدون; FIB; Focused Ion Beam; MBLEM; Multi Beam Laboratory for Engineering Microscopy; SANS; Small Angle Neutron Scattering; SEM; Scanning Electron Microscopy; TEM; Transmission Electron Microscopy; YPSZ; Yttria Partially Stabilised Zirconia; Dental porcelain; N