Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; All-solid-state lithium ion batteries; Time-of-flight secondary ion mass spectrometry; Li ion mapping;
مقالات ISI طیف سنجی جرم یونی ثانویه زمان پرواز (ترجمه نشده)
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Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Single cell analysis; Lipids; Time-of-flight secondary ion mass spectrometry; Noble metal/matrix enhancement; Mass spectrometry imaging;
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; ACh+; Acetylcholine; AOCB[6]; (Allyloxy)12 cucurbit[6]uril; AFM; Atomic force microscopy; cAMP; 3',5'-Cyclic monophosphate; ChemFET; Chemical field-effect transistor; CB[6]; Cucurbit[6]uril; DDFTTF; 5,5â²-Bis-(7-dodecyl-9Hfluoren-2-yl)-2,2â²-bithiop
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; dry powder inhaler (DPI); force control agent (FCA); blending method; dispersibility; next generation impactor (NGI); single particle aerosol mass spectrometry (SPAMS); time-of-flight secondary ion mass spectrometry (ToF-SIMS); AFM; atomic force microscop
Non-negative matrix factorisation of large mass spectrometry datasets
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; Non-negative matrix factorization; Multivariate analysis; Hyperspectral imaging; Fingerprints; MapReduce; Large datasets; Big data;
Critical review and trends in forensic investigations of crossing ink lines
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Forensic chemistry; Questioned documents; Ink analysis; Crossing inks; Intersecting lines; Pen ink; AFM; Atomic Force Microscopy; ALS; Alternating Least Squares; ANOVA; Analysis of Variance; ATR-FTIR; Attenuated Total Reflectance-Fourier Transform Infra
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Multiple myeloma; Time-of-flight secondary ion mass spectrometry; Palmitic acid; Fatty acid; Apoptosis;
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; Liquid chromatography coupled electrospray ionization–tandem mass spectrometry; Breast cancer; Cancer stem cell; Palmitoleic acidTOF-SIMS, time-of-flight secondary ion mass spectrometry; FACS, fluorescence a
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 2D/3D; two/three dimensional; AA; amino acid; AFM; atomic force microscope/microscopy; ATRP; atom transfer radical polymerization; BCA; bicinchoninic acid; bFGF; basic fibroblast growth factor; BSA; bovine serum albumin; CAM; cell adhesion molecule; CDI;
X-ray reflectometry and grazing-incidence X-ray fluorescence characterization of innovative electrodes for tantalum-based resistive random access memories
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Grazing-incidence X-ray fluorescence; Combined analysis; Resistive memory; Time-Of-Flight Secondary Ion Mass Spectrometry;
Time-of-flight secondary ion mass spectrometry study on Be/Al-based multilayer interferential structures
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Be/Al-based multilayers; Magnetron sputtering; Depth profiling; Time-of-flight secondary ion mass spectrometry; Barrier layer; X-ray interferential mirror;
Protein adsorption/desorption and antibody binding stoichiometry on silicon interferometric biosensors examined with TOF-SIMS
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; On-chip biosensor; Time-of-Flight Secondary Ion Mass Spectrometry; Multi-component layers; Biofunctionalization; Indirect immunoassay; Binding stoichiometry;
Physico-chemical properties of manufactured nanomaterials - Characterisation and relevant methods. An outlook based on the OECD Testing Programme
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Manufactured nanomaterials; Physico-chemical properties; Characterisation; OECD test guidelines; Working party on manufactured nanomaterials; 2D; two dimensional; 3D; three dimensional; AES; Auger electron spectroscopy; AFM; Atomic force microscopy; ATOF-
Contact pin-printing of albumin-fungicide conjugate for silicon nitride-based sensors biofunctionalization: Multi-technique surface analysis for optimum immunoassay performance
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Immunosensor biofunctionalization; Contact pin-printing; Silicon nitride; Atomic force microscopy; Time-of-flight secondary ion mass spectrometry; Spectroscopic ellipsometry;
Effects of silane- and MDP-based primers application orders on zirconia-resin adhesion-A ToF-SIMS study
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Zirconia; 3-Methacryloyloxypropyltrimethoxysilane; 10-Methacryloyloxydecyl-dihydrogen-phosphate; Time-of-flight secondary ion mass spectrometry; Wettability; Bond strength;
Mechanisms of enhanced lithium intercalation into thin film V2O5 in ionic liquids investigated by X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Vanadium pentoxide; Room temperature ionic liquid; Solid permeable interface layer; Atomic layer deposition; X-ray photoelectron spectroscopy; Time-of-flight secondary ion mass spectrometry;
Dendrimer pre-treatment enhances the skin permeation of chlorhexidine digluconate: Characterisation by in vitro percutaneous absorption studies and Time-of-Flight Secondary Ion Mass Spectrometry
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; PAMAM dendrimer; Time-of-Flight Secondary Ion Mass Spectrometry; Chlorhexidine; In vitro skin diffusion; Tape stripping; Penetration enhancer;
Orientation and biorecognition of immunoglobulin adsorbed on spin-cast poly(3-alkylthiophenes): Impact of polymer film crystallinity
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; polythiophene; antibody orientation; time-of-flight secondary ion mass spectrometry; principal component analysis; X-ray photoelectron spectroscopy; atomic force microscopy;
Effects of rapid thermal annealing on structural, chemical, and electrical characteristics of atomic-layer deposited lanthanum doped zirconium dioxide thin film on 4H-SiC substrate
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Lanthanum doped zirconium oxide; Atomic layer deposition; Rapid thermal annealing; X-ray photoelectron spectroscopy; Time-of-flight secondary ion mass spectrometry;
Imaging and chemical surface analysis of biomolecular functionalization of monolithically integrated on silicon Mach-Zehnder interferometric immunosensors
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Biosensor functionalization; On-chip immunoassay; Multi-molecular coverage; Time-of-flight secondary ion mass spectrometry; X-ray photoelectron spectroscopy; Atomic force microscopy;
Qualitative Time-of-Flight Secondary Ion Mass Spectrometry Analysis of Root Dentin Irrigated with Sodium Hypochlorite, EDTA, or Chlorhexidine
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Chlorhexidine; dentin; EDTA; sodium hypochlorite; time-of-flight secondary ion mass spectrometry
The role of ultra-thin carbon barrier layers for fabrication of La/B4C interferential mirrors: Study by time-of-flight secondary ion mass spectrometry and high-resolution transmission electron microscopy
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; High-resolution transmission electron microscopy; X-ray interferential mirror; Magnetron sputtering; Sputter depth profiling; Time-of-flight secondary ion mass spectrometry; Ultra-thin films
Surface orientation dependence of the activation energy of S diffusion in bcc Fe
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Segregation kinetics; Vacancy formation energy; Activation energy of diffusion; Migration energy; Schottky defect mechanism; Density functional theory; Time-of-flight secondary ion mass spectrometry; Auger electron spectroscopy; X-ray diffraction;
Analysis of thin baked-on silicone layers by FTIR and 3D-Laser Scanning Microscopy
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 3D-LSM; 3D-Laser Scanning Microscopy; AAS; atomic absorption spectrometry; AFM; Atomic Force Microscopy; ALT; average layer thickness; FTIR; Fourier transform infrared spectroscopy; ICP-OES; inductively coupled plasma optical emission spectrometry; LOD; l
Understanding the fate and biological effects of Ag- and TiO2-nanoparticles in the environment: The quest for advanced analytics and interdisciplinary concepts
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; AF4; asymmetrical flow-field flow fractionation; AAS; atomic absorption spectroscopy; AFM; atomic force microscopy; AS; activated sludge; BET; Brunauer-Emmett-Teller sorption model; CCC; critical coagulation concentration; CDI; charge determining ions
Effect on Al:MO2/In0.53Ga0.47As interface (M = Hf, Zr) of trimethyl-aluminum pre-treatment during atomic layer deposition
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Atomic layer deposition; Trimethylaluminum; Indium gallium arsenide; Zirconium dioxide; Time-of-flight secondary ion mass spectrometry; X-ray photoelectron spectroscopy
Protein adsorption and covalent bonding to silicon nitride surfaces modified with organo-silanes: Comparison using AFM, angle-resolved XPS and multivariate ToF-SIMS analysis
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Gamma globulins; Physical adsorption; Covalent bonding; Time-of-flight secondary ion mass spectrometry; Principal component regression;
Classification of time-of-flight secondary ion mass spectrometry spectra from complex Cu–Fe sulphides by principal component analysis and artificial neural networks
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; Cu–Fe sulphides; Flotation; Principle component analysis; Artificial neural networks
Evaluation of depth distribution and characterization of nanoscale Ta/Si multilayer thin film structures
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Nanoscale; Ta/Si multilayers; Time-of-flight secondary ion mass spectrometry; Depth resolution; Atomic mixing; X-ray reflectivity; Kelvin probe force spectroscopy;
Nanoscale Surface Characterization and Miscibility Study of a Spray-Dried Injectable Polymeric Matrix Consisting of Poly(lactic-co-glycolic acid) and Polyvinylpyrrolidone
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; PLGA; PVP; microspheres; controlled release; spray drying; DSC; atomic force microscopy; X-ray photoelectron spectroscopy; time-of-flight secondary ion mass spectrometry; nanothermal analysis
Carbon nanomembranes from self-assembled monolayers: Functional surfaces without bulk
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; ABPT; aminobiphenylthiol; AFM; atomic force microscope; AMBPT; (4â²-azomethylmalonodinitrile)-1,1â²-biphenyl-4-thiol; B1BPT; bis-1,1-biphenylthiol; B4BPT; bis-4,4-biphenylthiol; BBDS; bisbiphenyl-disulfanyl; BBPDT; bisbiphenylene-dithiol; BE; binding en
Chemical nature of the passivation layer depending on the oxidizing agent in Gd2O3/GeO2/Ge stacks grown by molecular beam deposition
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Germanium; Gadolinium oxide; Passivation layer; Molecular beam deposition; Time-of-flight secondary ion mass spectrometry
ToF-SIMS analysis of ocular tissues reveals biochemical differentiation and drug distribution
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Ocular; Drug; Time-of-flight secondary ion mass spectrometry; Principle component analysis; Multivariate statistics
Random projection for dimensionality reduction—Applied to time-of-flight secondary ion mass spectrometry data
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Chemometrics; Time-of-flight secondary ion mass spectrometry; Minerals; Projection; Simulation
Selective immobilization of Sonic hedgehog on benzylguanine terminated patterned self-assembled monolayers
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Site-directed immobilization; Benzylguanine transferase tag; Sonic hedgehog; Micro-patterning; Self-assembled monolayers; Time-of-flight secondary ion mass spectrometry
Lipid imaging with time-of-flight secondary ion mass spectrometry (ToF-SIMS)
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; SIMS; secondary ion mass spectrometry; ToF-SIMS; time-of-flight secondary ion mass spectrometry; MALDI; imaging mass spectrometry; IMS; matrix-assisted laser desorption ionization; DESI; desorption electrospray ionization; FAB; fast atom bombardment; Ga;
Oxygen distribution in nickel silicide films analyzed by time-of-flight secondary ion mass spectrometry
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; NiSi; Nickel silicide; LSI; Time-of-flight secondary ion mass spectrometry; TOF-SIMS; Oxygen distribution;
Analysis of intensities of positive and negative ion species from silicon dioxide films using time-of-flight secondary ion mass spectrometry and electronegativity of fragments
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 33.15.Ry; 33.15.Ta; 36.40.âc; 68.49.Sf; 68.55.Jk; 77.55.+f; Silicon dioxide; Fragment species; Time-of-flight secondary ion mass spectrometry; Electronegativity;
Surface view of the lateral organization of lipids and proteins in lung surfactant model systems—A ToF-SIMS approach
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; Chemical imaging; Surfactant protein B; Lung surfactant; Lipid–protein interaction; Lateral organization of membrane
Oriented immobilization of antibodies on a silicon wafer using Si-tagged protein A
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Immunoglobulin-binding protein; Oriented antibody immobilization; Si-tag; Silica-binding protein; Silicon wafer; Time-of-flight secondary ion mass spectrometry
Secondary ion species containing nitrogen atoms from plasma-enhanced chemical vapor deposited silicon oxide films on silicon
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 68.49.Sf; 68.55.Jk; 73.40.Qv; 77.55.+f; Silicon oxide; Nitrogen incorporation; Oxynitride; Secondary ion species; Time-of-flight secondary ion mass spectrometry;
Embedded structure of silicon monoxide in SiO2 films
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 61.43.Fs; 68.49.Sf; 68.49.Uv; 68.55.Jk; SiOx films; Silicon suboxides; X-ray photoelectron spectroscopy; Secondary ion species; Time-of-flight secondary ion mass spectrometry;
Time-of-flight secondary ion mass spectrometry, fluorescence microscopy and scanning electron microscopy: Combined tools for monitoring the process of patterning and layer-by-layer assembly of synthetic and biological materials
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Biomolecule–surface interactions; Self-assembled monolayers; Biosensors; Time-of-flight secondary ion mass spectrometry
Nitrogen mineralization and assimilation at millimeter scales
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Ammonification; Immobilization; Isotope dilution; Time-of-flight secondary ion mass spectrometry; SIMS; Nitrogen
An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; X-ray photoelectron spectroscopy; PVdF coating; Depth profiling; C60; Polymer
Polymer surface modification for the attachment of bioactive compounds
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Polymer surface modification; Surface analysis; Covalent attachment; Bioactive compounds; Biosensors; Biomaterials; AFM; atomic force microscopy; Ar; argon; ATR-FTIR; attenuated total reflectance Fourier transform infrared spectroscopy; BCA; bicinchoninic
Characterization of ion species of silicon oxide films using positive and negative secondary ion mass spectra
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Silicon oxides; Secondary ion species; Time-of-flight secondary ion mass spectrometry;
Using time-of-flight secondary ion mass spectrometry and multivariate statistical analysis to detect and image octabenzyl-polyhedral oligomeric silsesquioxane in polycarbonate
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Time-of-flight secondary ion mass spectrometry; Multivariate statistical analysis; Surface analysis; Polymer additive; Octabenzyl-polyhedral oligomeric silsesquioxane; Microscopy;
TOF-SIMS investigation of hydration of acetic acid adsorbed on amorphous water-ice surface
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; Acetic acid; Water; Hydration; Proton transfer reaction; Time-of-flight secondary ion mass spectrometry;
Influence of helium-ion bombardment on the surface properties of pure and ammonia-adsorbed water thin films
Keywords: طیف سنجی جرم یونی ثانویه زمان پرواز; 61.80.âx; 79.20.Rf; 82.80.Ms; 82.80.Rt; Water; Ammonia; H/D exchange; Sputtering; Time-of-flight secondary ion mass spectrometry;