کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10364810 | 871824 | 2005 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure Temperature and frequency dependent electrical and dielectric properties of Al/SiO2/p-Si (MOS) structure](/preview/png/10364810.png)
چکیده انگلیسی
The electrical and dielectric properties of Al/SiO2/p-Si (MOS) structures were studied in the frequency range 10Â kHz-10Â MHz and in the temperature range 295-400Â K. The interfacial oxide layer thickness of 320Â Ã
between metal and semiconductor was calculated from the measurement of the oxide capacitance in the strong accumulation region. The frequency and temperature dependence of dielectric constant (εâ²), dielectric loss (εâ³), dielectric loss tangent (tan δ) and the ac electrical conductivity (Ïac) are studied for Al/SiO2/p-Si (MOS) structure. The electrical and dielectric properties of MOS structure were calculated from C-V and G-V measurements. Experimental results show that the εⲠand εⳠare found to decrease with increasing frequency while Ïac is increased, and εâ², εâ³, tan δ and Ïac increase with increasing temperature. The values of εâ², εⳠand tan δ at 100 kHz were found to be 2.76, 0.17 and 0.06, respectively. The interfacial polarization can be more easily occurred at low frequencies, and the number of interface state density between Si/SiO2 interface, consequently, contributes to the improvement of dielectric properties of Al/SiO2/p-Si (MOS) structure. Also, the effects of interface state density (Nss) and series resistance (Rs) of the sample on C-V characteristics are investigated. It was found that both capacitance C and conductance G were quite sensitive to temperature and frequency at relatively high temperatures and low frequencies, and the Nss and Rs decreased with increasing temperature. This is behavior attributed to the thermal restructuring and reordering of the interface. The C-V and G/Ï-V characteristics confirmed that the Nss, Rs and thickness of insulator layer (δ) are important parameters that strongly influence both the electrical and dielectric parameters and conductivity in MOS structures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 81, Issue 1, July 2005, Pages 140-149
Journal: Microelectronic Engineering - Volume 81, Issue 1, July 2005, Pages 140-149
نویسندگان
A. TatarogËlu, Å. Altındal, M.M. Bülbül,