کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
10620395 | 988619 | 2012 | 8 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Plastic and elastic strains in short and long cracks in Alloy 600 studied by polychromatic X-ray microdiffraction and electron backscatter diffraction
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The microscopic strain distributions were studied for stress corrosion cracks produced electrochemically in C-rings of Alloy 600 (0.65 Ni, 0.16 Cr, 0.08 Fe). The strain data were obtained using polychromatic X-ray microdiffraction (PXM) and (in part) by electron back-scatter diffraction (EBSD). PXM was used to measure plastic and elastic strain distributions around the tip of a short crack, along with the changes to the direction and shape of the diffraction spots (ellipticity). For a sample with a short (30 μm) crack, the misorientation map showed a well-defined region of plastic deformation along the grain boundary in advance of the crack tip, extending to the next triple point. For the large crack sample, plastic and elastic stains as well as crystalline order could be measured in high detail with respect to the crack path. However, no correlation between these could be obtained, except for a notable degradation of crystalline order near the crack mouth. A comparable EBSD misorientation map shows strong correlation between misorientation and the crack edges; this may in part reflect the role of sharp edges in the more surface-sensitive approach.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 60, Issue 15, September 2012, Pages 5508-5515
Journal: Acta Materialia - Volume 60, Issue 15, September 2012, Pages 5508-5515
نویسندگان
Jing Chao, Marina L. Suominen Fuller, Nathaniel Sherry, Jinhui Qin, N. Stewart McIntyre, Jaganathan Ulaganathan, Anatolie G. Carcea, Roger C. Newman, Martin Kunz, Nobumichi Tamura,