Growth behavior of superconducting DyBa2Cu3O7–x thin films deposited by inclined substrate deposition for coated conductors

Superconducting DyBa2Cu3O7–x (DyBCO) films were grown on biaxially textured MgO buffer layers deposited by inclined substrate deposition (ISD) on Hastelloy substrates. Despite the large lattice mismatch (8.5%) between DyBCO and MgO, the DyBCO grew epitaxially on the MgO buffer layer and the biaxial texture of the MgO was well transferred to the DyBCO. Typical critical current densities, jc, of the DyBCO film were 2.1 MA cm−2 at 77 K in a self-field. Biaxial texturing is the key for reaching the high critical current densities and was investigated by transmission electron microscopy. DyBCO grains were found to be ∼130–500 nm in size, with faceted grain boundaries. The c-axis of the DyBCO grains was tilted away from the substrate normal by 29° such that it was perpendicular to the MgO (0 0 2) facets. A high dislocation density of ∼7.4 × 1011 cm−2 and stacking faults along the ab-planes were observed in the DyBCO film. Interface, grain boundary and volume energies of the DyBCO film were calculated and a growth model for the DyBCO film is discussed. ISD offers the potential for high-quality, biaxially textured MgO buffer layers suitable for long-length superconducting coated conductors.

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