کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1447764 988654 2010 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Atomic-scale imaging and the effect of yttrium on the fracture toughness of silicon carbide ceramics
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Atomic-scale imaging and the effect of yttrium on the fracture toughness of silicon carbide ceramics
چکیده انگلیسی

In SiC sintered with Al, B and C additions (ABC–SiC), the presence of Y in the Al–Si–O–C grain-boundary phase leads to less frequent crack deflection and lower toughness. When Y is absent from the grain-boundary phase and remains in the triple pockets, crack deflection is restored, and higher toughness results from grain-bridging mechanisms. The observations are consistent with elastic modulus changes in the intergranular phase, which depend on their yttria and silica content, and indicate that these can play an important role in determining crack deflection. While high-toughness ceramics such as ABC–SiC and Si3N4 rely on sintering additives forming crack-deflecting intergranular films, the present case is a striking example where the presence of a segregant in the grain boundary promotes transgranular fracture by raising the modulus of the nanoscale intergranular grain-boundary film.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 58, Issue 8, May 2010, Pages 2999–3005
نویسندگان
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