کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1449283 988698 2009 8 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
TEM investigation of interfaces during cuprous island growth
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
TEM investigation of interfaces during cuprous island growth
چکیده انگلیسی

The geometry and epitaxial relationships of interfaces generated during the early-stage oxidation of Cu(1 0 0) surfaces were studied using transmission electron microscopy. The predominant orientation relationship between Cu2O islands and the Cu substrate is cube-on-cube growth, whereby equivalent planes and directions of oxide islands and the metal substrate are matched across the interface, while other epitaxies are occasionally observed. A 6 × 7 coincidence site lattice configuration is observed at the Cu–Cu2O interface for the cube-on-cube epitaxy. The geometry of Cu2O–Cu interfaces is found to depend on the specific epitaxial orientations of Cu2O islands with the Cu substrate: wedge-shaped interfaces are developed for cube-on-cube growth, and edge-on interfaces are formed for other epitaxies. These growth features are attributed to the minimization of the interface energy via the competing factors among the coincidence lattice misfit, misfit dislocations and the metal–oxide interface area.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 57, Issue 15, September 2009, Pages 4432–4439
نویسندگان
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