کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1449307 | 988699 | 2008 | 11 صفحه PDF | دانلود رایگان |
NiO/Ce0.8Gd0.2O1.9−x (NiO/CGO) films with thicknesses between 150 and 800 nm were prepared by spray pyrolysis. Average grain sizes were 5–260 nm after annealing in air at 600–1200 °C. After reduction, the Ni/CGO cermet microstructures were stable up to temperatures of 600 °C for grain sizes of 53 nm. Nickel coarsening was observed for films with smaller grains. The development of a rigid CGO grain network helped to prevent nickel growth. The electrical conductivities of the films were comparable to state-of-the-art Ni–YSZ cermets and reached 3000 S cm−1 at 600 °C. Films with stable microstructures showed no degradation in electrical conductivity over 1400 h at 570 °C and upon thermal cycling. A transition from three-dimensional metallic percolation of cermets with small grains and large thickness to two-dimensional percolation for films with grain sizes in the range of the layer thickness was observed.
Journal: Acta Materialia - Volume 56, Issue 4, February 2008, Pages 677–687