کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1450779 | 988745 | 2007 | 7 صفحه PDF | دانلود رایگان |

The distribution of segregation levels of bismuth to grain boundaries in copper has been measured and compared using Auger electron spectroscopy (AES) and X-ray energy-dispersive spectroscopy (XEDS) in a scanning transmission electron microscope (STEM). The STEM-XEDS measurements showed that there are large numbers of grain boundaries with very low segregation levels which, as they are not embrittled, are not analysed using AES. A crystallographic analysis of a small number of boundaries showed that low segregation levels were not necessarily associated with special, high symmetry boundaries. These results indicate that only a part of the segregation behaviour can be explained by any results obtained using AES and that understanding the relationship between crystallography and brittle behavior will require going beyond a misorientation analysis.
Journal: Acta Materialia - Volume 55, Issue 15, September 2007, Pages 5149–5155