کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1450779 988745 2007 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Variability in the segregation of bismuth between grain boundaries in copper
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سرامیک و کامپوزیت
پیش نمایش صفحه اول مقاله
Variability in the segregation of bismuth between grain boundaries in copper
چکیده انگلیسی

The distribution of segregation levels of bismuth to grain boundaries in copper has been measured and compared using Auger electron spectroscopy (AES) and X-ray energy-dispersive spectroscopy (XEDS) in a scanning transmission electron microscope (STEM). The STEM-XEDS measurements showed that there are large numbers of grain boundaries with very low segregation levels which, as they are not embrittled, are not analysed using AES. A crystallographic analysis of a small number of boundaries showed that low segregation levels were not necessarily associated with special, high symmetry boundaries. These results indicate that only a part of the segregation behaviour can be explained by any results obtained using AES and that understanding the relationship between crystallography and brittle behavior will require going beyond a misorientation analysis.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Acta Materialia - Volume 55, Issue 15, September 2007, Pages 5149–5155
نویسندگان
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