کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1555215 | 1513257 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Correlation between structural and electrical properties of InN thin films prepared by molecular beam epitaxy
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
The strain-relaxation phenomena and the formation of a dislocation network in 2H2H-InN epilayers during molecular beam epitaxy are reported. The proposed growth model emphasizes the dominant role of the coalescence process in the formation of a dislocation network in 2H2H-InN. Edge type threading dislocations and dislocations of mixed character have been found to be the dominating defects in wurtzite InN layers. It is demonstrated that these dislocations are active suppliers of electrons and an exponential decay of their density with the thickness implies a corresponding decay in the carrier density. Room temperature mobility in excess of 1500 cm2 V −1 s−1 was obtained for ∼800 nm thick InN layers with dislocation densities of ∼3×109 cm−2.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Superlattices and Microstructures - Volume 40, Issues 4–6, October–December 2006, Pages 289–294
Journal: Superlattices and Microstructures - Volume 40, Issues 4–6, October–December 2006, Pages 289–294
نویسندگان
V. Lebedev, F.M. Morales, V. Cimalla, J.G. Lozano, D. González, M. Himmerlich, S. Krischok, J.A. Schaefer, O. Ambacher,