Free volume distribution at the Teflon AF®/silicon interfaces probed by a slow positron beam

Free volume distribution at the Teflon AF®/silicon interfaces probed by a slow positron beam

Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Polymer - Volume 52, Issue 2, 21 January 2011, Pages 505-509

Stephan Harms, Klaus Rätzke, Vladimir Zaporojtchenko, Franz Faupel, Werner Egger, Luca Ravelli,