کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
728875 | 892858 | 2012 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Dopant-defect interactions in Ge: Density functional theory calculations
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
مهندسی برق و الکترونیک
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چکیده انگلیسی
Germanium is being actively considered by the semiconductors community as a mainstream material for nanoelectronics application. This is driven by its advantageous materials properties, however, the defect processes in germanium are less understood as compared to silicon. In the present review recent developments in the study of impurities including dopant-defect interactions, diffusion and point defect engineering are discussed. The focus is on technologically important p-type and n-type dopants but important impurities such as oxygen are also discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Materials Science in Semiconductor Processing - Volume 15, Issue 6, December 2012, Pages 691–696
Journal: Materials Science in Semiconductor Processing - Volume 15, Issue 6, December 2012, Pages 691–696
نویسندگان
A. Chroneos,