کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
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729458 | 1461428 | 2014 | 8 صفحه PDF | دانلود رایگان |
Various and versatile applications of alumina in materials science and engineering specially in semiconductor and energy conversion technology encouraged us to prepare and investigate its physical properties as much as possible. Hence, after depositing of alumina thin films on glass substrates by a spray pyrolysis technique, structural, morphological, and optical properties of the films were investigated using X-ray diffraction (XRD), scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS), Fourier transform infrared spectroscopy (FTIR) and UV–visible spectrophotometry. Different optical quantities, such as optical band gap, refractive index and extinction coefficient, were determined in this article for different molarities (from 0.10 M to 0.25 M) at two specific substrate temperatures (250 °C and 500 °C). XRD results showed the prevailing amorphous phase in all samples as expected, whereas SEM, XPS, and FTIR presented the presence of molarity effects on alumina properties. Decrease of optical transmittance with molarity increase was notable. Using the transmittance data other optical quantities were obtained by a numerical approximation method.
Journal: Materials Science in Semiconductor Processing - Volume 18, February 2014, Pages 80–87