کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
9670316 1450401 2005 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Self-annealing and aging effect characterization on copper seed thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Self-annealing and aging effect characterization on copper seed thin films
چکیده انگلیسی
Seed-aging effect study underlines a dependency of the optical reflectivity on surface chemical contamination, whereas it does not seem affected by the evolution of surface roughness. Copper oxidation in air is due to the formation of a bi-layer of Cu2O and Cu(OH)2, the latter showing a weak stability under high vacuum environment. Vacuum annealed samples present a significant increase in reflectivity values, which is maintained even after many hours from copper seed deposition.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronic Engineering - Volume 82, Issues 3–4, December 2005, Pages 289-295
نویسندگان
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