Keywords: طیف سنج الکترونی آگر; ZnO; Semiconductor; Thin film; X-ray diffraction; Rutherford backscattering spectroscopy; Auger electron spectroscopy;
مقالات ISI طیف سنج الکترونی آگر (ترجمه نشده)
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Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Monte Carlo simulation; Attenuation length; Film thickness;
Keywords: طیف سنج الکترونی آگر; Ion-atom collisions; Auger electron spectroscopy; Metastable states; Effective solid angle; Hemispherical deflection analyzer; SIMION;
Keywords: طیف سنج الکترونی آگر; Yttrium oxide; X-ray photoelectron spectroscopy; Scanning electron microscopy; Auger electron spectroscopy; Elastic-peak electron spectroscopy; Electron inelastic mean free path;
Keywords: طیف سنج الکترونی آگر; 2D; Two-Dimensional; 2DEG; Two-Dimensional Electron Gas; 2DPS; Two-Dimensionally-Periodic Slab; 3D; Three-Dimensional; AES; Auger Electron Spectroscopy; AFM; Atomic Force Microscopy; ARUPS; Angle-Resolved Ultraviolet Photoemission Spectroscopy; B3LYP; Bec
Keywords: طیف سنج الکترونی آگر; Reactor pressure vessel steel; Temper brittleness; Surveillance specimens; Grain boundary segregation; APT; AES; Phosphorus-carbon competition; Phosphorus segregation kinetics; RPV; reactor pressure vessel; WM; weld metal; BM; base metal; AES; Auger elect
Keywords: طیف سنج الکترونی آگر; AES; auger electron spectroscopy; AFM; atomic force microscopy; APDBs; antiphase domain boundaries; CEMS; conversion electron Mössbauer spectroscopy; CTR; crystal truncation rod; DBT; distorted bulk truncation; DFT; density functional theory; DFT+U; dens
Keywords: طیف سنج الکترونی آگر; A3. Molecular beam epitaxy; Lithium perchlorate; Niobium oxides; Auger electron spectroscopy;
Keywords: طیف سنج الکترونی آگر; Nitriding; Steel; Anisotropic elasticity; X-ray diffraction; Auger electron spectroscopy;
Keywords: طیف سنج الکترونی آگر; AES; Auger electron spectroscopy; BGO; Bismuth germanium oxide (Bi4Ge3O12); CRB; cosmic radiation background; CVD; chemical vapor deposition; ERD(A); elastic recoil detection (analysis); DFT; density functional theory; FET; field effect transistor; FGA; f
Keywords: طیف سنج الکترونی آگر; a-C; amorphous carbon; AES; auger electron spectroscopy; BOPP; biaxially-oriented polypropylene; DLC; diamond-like carbon; GIXRD; grazing-incidence X-ray diffraction; HACNT; horizontally aligned carbon nanotubes; HOPG; highly ordered pyrolytic graphite; L
Keywords: طیف سنج الکترونی آگر; EM; electron microscopy; TEM; transmission electron microscopy; SEM; scanning electron microscopy; CCD; charge-coupled device; SE; secondary electron; BSE; backscattered electrons; TSEM; transmission scanning electron microscopy; STEM; scanning transmissi
Keywords: طیف سنج الکترونی آگر; 2DEG; two-dimensional electron gas; 3HeSE; 3He spin echo (spectroscopy); AES; Auger electron spectroscopy; AM; alkali metal; amu; atomic mass units; ASP; acoustic surface Plasmon; CDO; charge density oscillation; DFPT; density functional perturbation theo
Investigation of the dependence of phosphorus segregation on grain boundary structure in Fe-P-C alloy: Ñross comparison between Atom Probe Tomography and Auger Electron Spectroscopy
Keywords: طیف سنج الکترونی آگر; Grain boundary; Phosphorus segregation; Atom Probe Tomography; Auger Electron Spectroscopy; Transmission Kikuchi Diffraction;
Auger electron spectroscopy analysis for growth interface of cubic boron nitride single crystals synthesized under high pressure and high temperature
Keywords: طیف سنج الکترونی آگر; Cubic boron nitride; Hexagonal boron nitride; Growth interface; Auger electron spectroscopy; Transition mechanism;
Control of tribofilm formation in dry machining of hardened AISI D2 steel by tuning the cutting speed
Keywords: طیف سنج الکترونی آگر; Tribofilms; Tribo-oxidation; Hard turning of D2 steel; X-ray photoelectron spectroscopy; Auger Electron Spectroscopy; Tuning cutting speeds;
Electron pair emission from a Pb surface at room temperature
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Electron emission; Photoelectron emission; Auger photoelectron coincidence spectroscopy;
Detecting Fermi-level shifts by Auger electron spectroscopy in Si and GaAs
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Semiconductor surface; Fermi level shifts; Surface cleaning;
Composition effects of electrodeposited Co-Fe as electrocatalysts for the oxygen evolution reaction
Keywords: طیف سنج الکترونی آگر; Oxygen evolution reaction; Co-Fe; Electrodeposition; Zn-air battery; Auger electron spectroscopy;
Effect of Ti interlayer on interfacial thermal conductance between Cu and diamond
Keywords: طیف سنج الکترونی آگر; Sputter deposition; Multilayer thin films; Auger electron spectroscopy; STEM; Time-domain thermoreflectance;
Physico-chemical properties of manufactured nanomaterials - Characterisation and relevant methods. An outlook based on the OECD Testing Programme
Keywords: طیف سنج الکترونی آگر; Manufactured nanomaterials; Physico-chemical properties; Characterisation; OECD test guidelines; Working party on manufactured nanomaterials; 2D; two dimensional; 3D; three dimensional; AES; Auger electron spectroscopy; AFM; Atomic force microscopy; ATOF-
Revisiting the electrical and optical transmission properties of co-doped ZnO thin films as n-type TCOs
Keywords: طیف سنج الکترونی آگر; TCO; transparent conducting oxide; ITO; indium tin oxide; LED; light emitting diode; LCD; liquid crystal display; FPD; flat panel display; OLED; organic light emitting diode; PV; photovoltaic; eV; electron volt; Ï; resistivity; k; Boltzmann constant; T;
Inhomogeneous distribution of oxygen in sintered Ti-Nd alloy
Keywords: طیف سنج الکترونی آگر; Metals and alloys; Powder technology; Titanium; Neodymium addition; Auger electron spectroscopy; Low-oxygen ring;
Al2O3 thin films prepared by plasma-enhanced chemical vapor deposition of dimethylaluminum isopropoxide
Keywords: طیف سنج الکترونی آگر; Aluminum oxide; Dimethylaluminum isopropoxide; Plasma-enhanced chemical vapor deposition; Auger electron spectroscopy; X-ray photoelectron spectroscopy; Fourier transform Infrared spectroscopy;
Temperature induced upconversion behaviour of Ho3+-Yb3+ codoped yttrium oxide films prepared by pulsed laser deposition
Keywords: طیف سنج الکترونی آگر; Frequency upconversion; Thin films; PLD technique; Substrate temperature; Power dependence; Auger electron spectroscopy;
3D Auger quantitative depth profiling of individual nanoscaled III-V heterostructures
Keywords: طیف سنج الکترونی آگر; 81.05.Ea; 81.07.St; 68.65.Fg; 68.37.Xy; MOSFETs; metal oxide semiconductor field effect transistors; QWFETs; quantum well field effect transistors; QW; quantum well; RSFs; relative sensitivity factors; AES; Auger electron spectroscopy; SIMS; secondary ion
Effects of boron on the fracture behavior and ductility of cast Ti-6Al-4V alloys
Keywords: طیف سنج الکترونی آگر; Ti-6Al-4V alloy; Grain boundary segregation; Auger electron spectroscopy; Ductility; Fracture;
Changes of PbSnTe thin film thickness due to the oxidation by different methods
Keywords: طیف سنج الکترونی آگر; IV-VI semiconductor compounds; Oxides; Auger Electron Spectroscopy; Depth profile; Electrochemical oxidation;
Influence of the “surface effect” on the segregation parameters of S in Fe(100): A multi-scale modelling and Auger Electron Spectroscopy study
Keywords: طیف سنج الکترونی آگر; Auger Electron Spectroscopy; Density Functional Theory; Fe(100); Vacancy formation energy; Diffusion; Surface segregation; Migration energy; Activation energy; Interaction parameter; Segregation energy; Surface effect;
An ultrathin multilayer TiN/SiN wear resistant coating for advanced magnetic tape drive heads
Keywords: طیف سنج الکترونی آگر; Ultra-thin coatings; Multilayers; Nitrides; Magnetic recording; Tribology; Sputtering; X-ray diffraction; Auger electron spectroscopy;
The diffusion doping of Cu crystals with 0.1Â at.% In at high annealing temperatures for surface segregation measurements
Keywords: طیف سنج الکترونی آگر; Indium; Segregation; Copper; Thin films; CuIn phases; Auger electron spectroscopy; Doping;
Grain boundary embrittlement by Mn and eutectoid reaction in binary Fe-12Mn steel
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Grain boundary embrittlement; Grain boundary segregation; High Mn steel; Eutectoid reaction;
Interaction of highly dissociated low pressure hydrogen plasma with W-C thin film deposits
Keywords: طیف سنج الکترونی آگر; Hydrogen plasma; Tungsten-carbon deposits; Erosion; Multilayers; Auger Electron Spectroscopy; X-ray Diffraction;
AES and FTIR characterization of sol-gel alumina films
Keywords: طیف سنج الکترونی آگر; Sol-gel; Alumina films; Dip-coating; FTIR; Auger electron spectroscopy;
Practical aspects of Boersch phase contrast electron microscopy of biological specimens
Keywords: طیف سنج الکترونی آگر; Phase plate; Transmission electron microscopy; Aberration correction; X-ray photoelectron spectroscopy; Auger electron spectroscopy; Helium ion microscopy;
Formation of single-phase BaO nanoclusters
Keywords: طیف سنج الکترونی آگر; Barium oxide; Sublimation; Cluster; X-ray photoelectron spectroscopy; Auger electron spectroscopy; Scanning tunneling microscopy;
Grain boundary microstructure and fatigue crack growth in Allvac 718Plus superalloy
Keywords: طیف سنج الکترونی آگر; Delta-phase; Fractography; Oxidation; Hold-time fatigue; Electron microscopy; X-ray photoelectron spectroscopy; Auger electron spectroscopy;
Interfacial Structure of Ta2O5/Si Film and Photoactivity
Keywords: طیف سنج الکترونی آگر; Ta2O5/Si thin film; Auger electron spectroscopy; Interface diffusion; Interface reaction; Photocatalytic activity;
Surface structure and electronic states of sulfur-treated InP(1Â 1Â 1)A studied by LEED, AES, STM, and IPES
Keywords: طیف سنج الکترونی آگر; 68.35.âp; 68.35.Bs; 73.20.âr; 73.20.At; Auger electron spectroscopy; Low-energy electron diffraction; Scanning tunneling microscopy; Inverse photoemission spectroscopy; Surface relaxation and reconstruction; Indium phosphide;
Bone calcium, phosphorus detection by Auger electron spectroscopy
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Calcium; Phosphorus; Cortical bone;
Electron irradiation effect on depth profiling of a SiO2/Si(1Â 0Â 0) surface by Auger electron spectroscopy
Keywords: طیف سنج الکترونی آگر; 82.80.Pv; 82.20.Pm; 82.65.Yh; 61.80.Az; 61.80.âx; Auger electron spectroscopy; Electron stimulated desorption; Adsorption; Ion sputtering rate; Depth resolution;
Modification of WC hard alloy by compressive plasma flow
Keywords: طیف سنج الکترونی آگر; 52.40.Hf; 61.43.Gt; 64.70.Kb; 81.40.Cd; Scanning electron microscopy; X-ray diffraction; Auger electron spectroscopy; Pulsed plasma; Tungsten cardbide;
The structural and dielectric properties of SiOx/a-C,F/SiOx multi-layer thin films deposited by microwave electron cyclotron resonance plasma method
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Chemical vapor deposition; Fourier transform infrared spectroscopy; Dielectric properties; 82.80.Pv; 81.15.Gh; 78.30.âj; 77.22.âd;
Influence of forced flectional vibrations on SF6 absorption on stainless steel FeNi
Keywords: طیف سنج الکترونی آگر; Adsorption; SF6; Vibration; Gas sensors; Auger electron spectroscopy;
Surface segregation kinetics of sulfur influenced by various conditions in thin-gauged 3% Si-Fe alloy strips
Keywords: طیف سنج الکترونی آگر; Iron alloys; Segregation; Auger electron spectroscopy; Annealing;
Temper embrittlement dynamics induced by non-equilibrium segregation of phosphorus in steel 12Cr1MoV
Keywords: طیف سنج الکترونی آگر; Steels; Auger electron spectroscopy; Grain boundaries segregation; Temper embrittlement;
An Auger microscopy study of the meeting and interdiffusion of pure Pb and Bi adsorbed layers on polycrystalline Cu
Keywords: طیف سنج الکترونی آگر; Auger electron spectroscopy; Surface diffusion; Copper; Lead; Bismuth;
Sb adsorption and desorption pathways on (2Â ÃÂ 1) and c(4Â ÃÂ 4) reconstructed Si(0Â 0Â 1) surfaces
Keywords: طیف سنج الکترونی آگر; Silicon; Antimony; Metal-semiconductor interfaces; Adsorption kinetics; Epitaxy; Low energy electron diffraction (LEED); Auger electron spectroscopy;
Boronizing structures of Si(1Â 1Â 3) surfaces
Keywords: طیف سنج الکترونی آگر; Scanning tunneling microscopy; Ion implantation methods; Auger electron spectroscopy; Surface relaxation and reconstruction; High index single crystal surfaces; Boron; Silicon;
Ion desorption induced by FÂ 1s region transitions of poly(tetrafluoroethylene)
Keywords: طیف سنج الکترونی آگر; Photon stimulated desorption (PSD); Auger electron spectroscopy; Auger electron photo-ion coincidence (AEPICO); Poly(tetrafluoroethylene) (PTFE); Kinetic energy distribution;