Keywords: خوشه یون; Single-ion hydration; Molecular modeling; Extrathermodynamic assumption; Cluster ion; Surface potential;
مقالات ISI خوشه یون (ترجمه نشده)
مقالات زیر هنوز به فارسی ترجمه نشده اند.
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در صورتی که به ترجمه آماده هر یک از مقالات زیر نیاز داشته باشید، می توانید سفارش دهید تا مترجمان با تجربه این مجموعه در اسرع وقت آن را برای شما ترجمه نمایند.
Keywords: خوشه یون; Cluster ion; Stopping power; Average charge; Dielectric function;
Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+-Ar+ cosputtering
Keywords: خوشه یون; Cluster ion; C60+-sputtering; X-ray photoelectron spectrometry (XPS); Secondary ion mass spectrometry (SIMS); Depth profiles; Temperature effect;
Effect of collision cascade density on swelling and surface topography of GaN
Keywords: خوشه یون; GaN; Ion irradiation; Cluster ion; Surface topography; Swelling; Cascade density;
Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization
Keywords: خوشه یون; Cluster ion; Surface analysis; Secondary ion
Parallel detection, quantification, and depth profiling of peptides with dynamic-secondary ion mass spectrometry (D-SIMS) ionized by C60+–Ar+ co-sputtering
Keywords: خوشه یون; Secondary ion mass spectrometry; Cluster ion; Co-sputtering; Depth profile
Cluster effect on projected range of 30Â keV C60+ in silicon
Keywords: خوشه یون; Cluster ion; Projected range; C60;
A new cluster-ion-beam source for secondary ion mass spectrometry (SIMS) using the electrospray of a pure ionic liquid under high vacuum
Keywords: خوشه یون; Electrospray; Ionic liquid; Charged droplet; Cluster ion; Ion beam; SIMS
Bismuth carbide cluster ions produced by a gas aggregation source
Keywords: خوشه یون; Bismuth; Carbide; Cluster ion; Gas aggregation; Time-of-flight mass spectrometry
Nano-processing with gas cluster ion beams
Keywords: خوشه یون; Nano-process; Cluster ion; Reactive sputtering; Smoothing; Low damage;
Gas-phase vibrational spectroscopy and ab initio calculations of Rb+(H2O)n and Rb+(H2O)nAr cluster ions
Keywords: خوشه یون; Infrared spectroscopy; Photodissociation; Cluster ion; Noncovalent interaction; Rubidium;
HOPG surface irradiated by metal cluster complex ions
Keywords: خوشه یون; Cluster ion; Ion irradiation; HOPG
Cluster ion formation of alkali halides by electrospray droplet impact
Keywords: خوشه یون; Alkali halide; Electrospray droplet impact; Cluster ion; SIMS
Gas-phase ion/molecule reactions in C2F4
Keywords: خوشه یون; High-pressure mass spectrometry; Cluster ion; Tetrafluoroethylene; Halide ion
Cluster induced chemistry at solid surfaces: Molecular dynamics simulations of keV C60 bombardment of Si
Keywords: خوشه یون; 61.43.Bn; 61.80.Az; 68.49.FgMolecular dynamics simulations; ToF-SIMS; Cluster ion; C60+; Sputtering; Si
SIMS depth profile study using metal cluster complex ion bombardment
Keywords: خوشه یون; 82.80.Ms; SIMS; Depth profile; Cluster ion; Ir4(CO)7+; Sputtering yield; Depth resolution;
Thermochemical stabilities of the gas-phase cluster ions of halide ions with rare gas atoms
Keywords: خوشه یون; High-pressure mass spectrometry; Cluster ion; Rare gas; Halide ion;
Crater annihilation on silver by cluster ion impacts
Keywords: خوشه یون; 36.40.âc; 61.80.Lj; 83.10.Mj; Cluster ion; Heavy ion; Irradiation; Crater formation; Silver; Molecular dynamics simulations;
A systematic study of ion and cluster ion formation in continuous supersonic planar plasma
Keywords: خوشه یون; Plasma expansion; Molecular ion; Ionic complex; Cluster ion; Quadrupole mass spectrometry
Molecular depth profiling of multi-layer systems with cluster ion sources
Keywords: خوشه یون; Molecular depth profiling; Trehalose film; Multi-layer; Cluster ion; ToF-SIMS; C60+;
ToF-SIMS analysis of a fluorocarbon-grafted PET with a gold cluster ion source
Keywords: خوشه یون; SIMS; Cluster ion; Polymer; Monolayer; Surface analysis; Sputter cross-section;
Matrix-enhanced secondary ion mass spectrometry: The Alchemist's solution?
Keywords: خوشه یون; Organic SIMS; Imaging SIMS; Matrix; ME-SIMS; MALDI; MetA-SIMS; Metal; Salt; Cluster ion;
Fundamental characteristics of liquid cluster ion source for surface modification
Keywords: خوشه یون; 36.40.Wa; 41.85.âp; 81.65.Cf; Ion beam; Cluster ion; Liquid cluster; Surface etching; Wet process;
Nano structure formation by gas cluster ion beam irradiations at oblique incidence
Keywords: خوشه یون; 79.20.Rf; 81.65.Cf; 41.75.Ak; Cluster ion; Ripple formation; Oblique incidence;
Gas phase antimony/tungsten/oxygen cluster cations
Keywords: خوشه یون; Antimony; Tungsten; Oxide; Cluster ion; Time-of-flight mass spectrometry;