کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1544471 1512884 2015 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Numerical investigation of the 2DEG properties of AlGaN/AlN/GaN HEMT structures with InGaN/GaN MQW back-barrier structure
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد مواد الکترونیکی، نوری و مغناطیسی
پیش نمایش صفحه اول مقاله
Numerical investigation of the 2DEG properties of AlGaN/AlN/GaN HEMT structures with InGaN/GaN MQW back-barrier structure
چکیده انگلیسی


• We calculated 2DEG properties for AlGaN/GaN HEMT structures with MQWs.
• We have investigated effects of MQWs on 2DEG in these HEMT structures.
• We proposed an optimized device structure using obtained findings.

The calculations of the two-dimensional electron gas (2DEG) properties of pseudomorphic Al0.15Ga0.85N/AlN/GaN/(InyGa1−yN/GaN)MQW/Al0.15Ga0.85N/AlN/GaN heterostructures are presented. The effects of InGaN/GaN Multi-Quantum Wells (MQWs) on the band structures and carrier densities were investigated with the help of the one dimensional self-consistent solutions of the non-linear Schrödinger–Poisson equations. The 2DEG carrier density increased and the 2DEG carrier confinement improved by the insertion of InGaN/GaN MQWs into AlGaN/GaN HEMT structures. Also, we found that 2DEG carrier density of second subband significantly increased with In mole fraction in InGaN/GaN MQW for AlGaN/GaN HEMT structures. We proposed an optimized device structure using these findings. The 2DEG properties obtained via numerical calculations help to produce devices which have better electrical properties for further investigation.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Physica E: Low-dimensional Systems and Nanostructures - Volume 65, January 2015, Pages 110–113
نویسندگان
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