کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1664646 | 1518016 | 2015 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structural features of spin-coated thin films of binary AsxS100 â x chalcogenide glass system
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Structural features of spin-coated thin films of binary AsxS100 â x chalcogenide glass system Structural features of spin-coated thin films of binary AsxS100 â x chalcogenide glass system](/preview/png/1664646.png)
چکیده انگلیسی
Spin-coating technology offers a convenient method for fabricating photostable chalcogenide glass thin films that are especially attractive for applications in IR optics. In this paper we report the structure of spin-coated AsxS100 â x (x = 30, 35, 40) thin films as determined using high resolution X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy, especially in relation to composition (i.e. As/S ratio) and preparation process variables. It was observed that As atoms during preparation have a tendency to precipitate out in close to stoichiometric compositions. The mechanism of bonding between the inorganic matrix and organic residuals is discussed based on the experimental data. A weak interaction between S ions and amine-based clusters is proposed as the basis of structural organization of the organic-inorganic interface.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 589, 31 August 2015, Pages 642-648
Journal: Thin Solid Films - Volume 589, 31 August 2015, Pages 642-648
نویسندگان
J. Cook, S. Slang, R. Golovchak, H. Jain, M. Vlcek, A. Kovalskiy,