کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1664711 1518018 2015 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Enhancement of memory windows in Pt/Ta2O5 − x/Ta bipolar resistive switches via a graphene oxide insertion layer
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Enhancement of memory windows in Pt/Ta2O5 − x/Ta bipolar resistive switches via a graphene oxide insertion layer
چکیده انگلیسی


• Graphene oxide (GO) layer functions as the strong conductive filaments.
• The GO insertion layer controls the low resistance states of bipolar switching.
• Memory windows of bipolar switching were intentionally manipulated.

The influence of a graphene oxide (GO) layer on Pt/Ta2O5 − x/Ta bipolar resistive switches, in which the GO layer is spin-coated on the Ta bottom electrode before the growth of a Ta2O5 − x switching element was examined. Experimental observations suggest that the insertion of the GO layer is crucial for adjusting the low resistance states without changing the high resistance states. Controlling GO layer thickness represents the variation of the forming voltage and on/off ratio, demonstrating enhanced memory windows. The possible nature of the enhanced switching events is described by adapting the creation of strong conductive filaments driven by a greater resistive GO layer.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 587, 31 July 2015, Pages 57–60
نویسندگان
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