کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1665161 | 1518042 | 2014 | 5 صفحه PDF | دانلود رایگان |
• Particle induced X-ray emission was used to analyze the composition of CZTSe films.
• Energy dispersive X-ray spectroscopy tends to underestimate the Sn composition.
• Local Raman intensity is related with the composition rather than the crystallinity.
Compositional and structural studies of Cu2ZnSnSe4 (CZTSe) thin films were carried out by X-ray diffraction, energy dispersive X-ray spectroscopy (EDS), particle induced X-ray emission (PIXE), photoluminescence, and Raman spectroscopy. CZTSe thin films with different compositions were deposited on sodalime glass by co-evaporation. The composition of the films measured by two different methods, EDS and PIXE, showed significant differences. Generally, the Zn/Sn ratio measured by EDS is larger than that measured by PIXE. Both the micro-PIXE and the micro-Raman imaging results indicated the compositional and structural inhomogeneity of the sample.
Journal: Thin Solid Films - Volume 562, 1 July 2014, Pages 109–113