Transparent conductive film by large area roll-to-roll processing

Highlight
• Controlled synthesis of silver nanowires using trace amount of Cl− ions
• Large area roll-to-roll processed transparent conductive (TC) coatings
• TC film has light transmission > 80% and sheet resistance < 100 Ω/sq.
• Silver containing ink achieved better property than conductive polymer ink.
• Used as the TC electrode for printed lighting device with proven performance

Sputtered indium tin oxide (ITO) coating on polyethylene terephthalate film has been used as the substrate for roll-to-roll fabrication of large area printed electronics devices, but it is expensive and could be cracked when bending, limiting its applications. Transparent conductive (TC) electrode made by roll-to-roll coating of transparent conductive ink on flexible substrate is an alternative, but both the ink material and the control of the coating quality are very crucial. The major challenges are the coating performance, coating uniformity and defect control during roll-to-roll processing. In this paper, we report the chemical synthesis of silver nanowires in preferred shape and size, the surface modification of the Ag nanowires for better dispersion into the commercial Poly(3,4-ethylenedioxythiophene) Poly(styrenesulfonate) (PEDOT:PSS) conductive polymer ink, and the controlled roll-to-roll coating process on flexible polyethylene terephthalate substrate by a one meter web-width roll-to-roll slot die coating system. We obtained high uniformity PEDOT:PSS coating with optical transmission higher than 80% and sheet resistance lower than 100 Ω/square, and silver containing coating with sheet resistance below 40 Ω/square and maintained optical transmittance. The slot die coating mechanism is investigated and the influencing factors for coating uniformity and defect are defined. The coated transparent conductive film has the same properties as the sputtered ITO and has been used as the TC electrode for printed lighting, whose performance has been proven by standard weathering test for 1000 h.