کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1666236 1518070 2013 11 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
XPS for chemical- and charge-sensitive analyses
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
XPS for chemical- and charge-sensitive analyses
چکیده انگلیسی
By recording X-ray photoelectron spectroscopic binding energy shifts, while subjecting samples to a variety of optical and electrical stimuli, information about charge accumulation on materials or surface structures can be obtained. These stimuli included d.c. as well as a.c. electrical and/or optical pulses covering a wide frequency range (10− 3 to 106 Hz) for probing charging and/or photovoltage shifts, stemming from impurities, dopants, defects, etc., whether created intentionally or not. The methodology is simple to implement and provides several new dimensions for thin films and materials analyses.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 534, 1 May 2013, Pages 1-11
نویسندگان
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