کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1666306 1518070 2013 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Application of Thomas–Reiche–Kuhn sum rule to construction of advanced dispersion models
چکیده انگلیسی

The classical f-sum rule is generalized using quantum mechanical Thomas–Reiche–Kuhn sum rule to include nucleonic contribution, i.e. lattice vibrations. The sum rule is formulated for the transition strength function defined as a continuous condensed-matter equivalent of the oscillator strength known for discrete transitions in atomic spectra. The application of such formulated sum rule allows construction of dispersion models containing a fitting parameter directly related to the atomic density of material. The dielectric response expressed using the transition strength function is split into individual contributions such as direct and indirect electronic interband transitions including excitonic effect, excitations of electrons to the high-energy states existing above the conduction band, core-electron excitations and phonon absorption. The presented models reflect understanding of structure of disordered and crystalline materials on the basis of quantum theory of solids. The usual term ‘joint density of states’, that should be used only for electronic transitions in the one-electron approximation, is replaced by the more general term ‘transition density’.


► Sum rules are generalized to include the nucleonic term.
► Transition strength function, similar to oscillator strength, is introduced.
► Density parameter related to transition strength is introduced to dispersion models.
► It is shown how to split total transition strength to individual excitation types.
► Dielectric function contributions for basic excitations are parametrized.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 534, 1 May 2013, Pages 432–441
نویسندگان
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