کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1666709 | 1518074 | 2013 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Stress measurement in coarse grained material with high-resolution X-ray beams Stress measurement in coarse grained material with high-resolution X-ray beams](/preview/png/1666709.png)
A method is proposed by which stresses can be measured in a polycrystalline material with a grain size comparable to the size of the probing X-ray, for instance if the X-ray is a high resolution synchrotron beam. The solution for the problem is the so-called matrix method together with an approximation to the components of the tensor F(ψ,φ,hkl), the so-called X-ray elastic factors.
► A method is presented for stress measurement with a high-resolution X-ray beam.
► Any (arbitrary) distribution of measurement directions (φ/ψ) is allowed.
► This is made possible using the matrix method for the stress calculation.
► The complete orientation information of the reflecting grains is not needed.
► The simulation of a measurement strongly supports the validity of the method.
Journal: Thin Solid Films - Volume 530, 1 March 2013, Pages 77–80