کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1666942 | 1518083 | 2012 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Optical wave microphone measurement during laser ablation of Si
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Optical wave microphone measurement during laser ablation of Si Optical wave microphone measurement during laser ablation of Si](/preview/png/1666942.png)
چکیده انگلیسی
Pulsed laser irradiation is used for surface treatment of a solid and ablation for particle formation in gas, liquid or supercritical phase media. When a pulsed laser is used to irradiate a solid, spatial refractive index variations (including photothermal expansion, shockwaves and particles) occur, which vary depending on the energy density of the pulsed laser. We focused on this phenomenon and applied an unique method for detection of refractive index variation using an optical wave microphone based on Fraunhofer diffraction. In this research, we analyzed the waveforms and frequencies of refractive index variations caused by pulsed laser irradiation of silicon in air and measured with an optical wave microphone.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 521, 30 October 2012, Pages 132–136
Journal: Thin Solid Films - Volume 521, 30 October 2012, Pages 132–136
نویسندگان
Fumiaki Mitsugi, Ryota Ide, Tomoaki Ikegami, Toshiyuki Nakamiya, Yoshito Sonoda,