کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1667079 1008841 2012 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Dielectric properties and resistance to fatigue failure of different barrier layers prepared on flexible stainless-steel foils by ion-beam assisted deposition
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Dielectric properties and resistance to fatigue failure of different barrier layers prepared on flexible stainless-steel foils by ion-beam assisted deposition
چکیده انگلیسی

A stainless-steel foil is an attractive candidate for the substrate of flexible display devices and integrated solar modules. For electrical insulation and ion diffusion reduction, a barrier layer should be coated on the stainless-steel foil surface. In this study, different barrier layers such as SiOx, TaOx, TiOx and TaOx/SiOx were prepared on the flexible stainless-steel foils (SUS 304) by ion-beam assisted deposition. The dielectric properties of the barrier layers, including resistance, reactance, leakage current density, breakdown field strength and performance index, were investigated. The resistance to fatigue failure of the barrier layers was evaluated by insulating tests after the specimen foils were flattened. The results show that the dielectric properties and the resistance to fatigue failure of the TaOx/SiOx composite barrier layer are better than those of the SiOx or the TaOx barrier layer. The best dielectric properties and resistance to fatigue failure are achieved with the 4-μm thick TaOx/SiOx composite barrier layer.


► SiOx, TaOx, TiOx and TaOx/SiOx barrier layers are prepared on stainless-steel.
► Barriers layers prepared by ion-beam assisted deposition.
► Dielectric properties and resistance to fatigue failure performance are compared.
► 4-μm thick TaOx/SiOx layers show good dielectric properties and resistance to fatigue failure.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 520, Issue 21, 31 August 2012, Pages 6556–6560
نویسندگان
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