کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1668360 | 1008867 | 2011 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Enhanced tunable dielectric properties of Ba0.5Sr0.5TiO3/Bi1.5Zn1.0Nb1.5O7 multilayer thin films by a sol–gel process Enhanced tunable dielectric properties of Ba0.5Sr0.5TiO3/Bi1.5Zn1.0Nb1.5O7 multilayer thin films by a sol–gel process](/preview/png/1668360.png)
Ba0.5Sr0.5TiO3(BST)/Bi1.5Zn1.0Nb1.5O7(BZN) multilayer thin films were prepared on Pt/Ti/SiO2/Si substrates by a sol–gel method. The structures and morphologies of BST/BZN multilayer thin films were analyzed by X-ray diffraction (XRD) and field-emission scanning electron microscope. The XRD results showed that the perovskite BST and the cubic pyrochlore BZN phases can be observed in the multilayer thin films annealed at 700 °C and 750 °C. The surface of the multilayer thin films annealed at 750 °C was smooth and crack-free. The BST/BZN multilayer thin films annealed at 750 °C exhibited a medium dielectric constant of around 147, a low loss tangent of 0.0034, and a relative tunability of 12% measured with dc bias field of 580 kV/cm at 10 kHz.
Journal: Thin Solid Films - Volume 520, Issue 2, 1 November 2011, Pages 789–792