کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1669427 1008883 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Frequency and temperature dependence of dielectric and electrical properties of radio-frequency sputtered lead-free K0.48Na0.52NbO3 thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Frequency and temperature dependence of dielectric and electrical properties of radio-frequency sputtered lead-free K0.48Na0.52NbO3 thin films
چکیده انگلیسی

Lead-free K0.48Na0.52NbO3 (KNN) ferroelectric thin films were prepared using the radio-frequency magnetron sputtering method. The crystallized KNN phase was confirmed using X-ray diffraction. The KNN thin film exhibited a well-saturated ferroelectric polarization-electric field hysteresis loop with high remanent polarization. The dielectric and electrical properties of the KNN thin film were investigated over a wide range of frequencies from 10 Hz to 1 MHz, and over a wide range of temperatures from 25 °C to 500 °C. The complex impedance relaxations are shown in an impedance Cole–Cole plot. With increasing temperature, the AC conductivity increased, which obeys the power law, σ(ω) = σ0 + Aωs. The activation energy for the conduction process is calculated to be 0.57 eV from the slope of the AC conductivity at the low frequency.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 22, 1 September 2010, Pages 6390–6393
نویسندگان
, , , , ,