کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1669438 1008883 2010 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
The etching characteristics of Al2O3 thin films in an inductively coupled plasma
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
The etching characteristics of Al2O3 thin films in an inductively coupled plasma
چکیده انگلیسی

In this study, the etching characteristics of ALD deposited Al2O3 thin film in a BCl3/N2 plasma were investigated. The experiments were performed by comparing the etch rates and the selectivity of Al2O3 over SiO2 as functions of the input plasma parameters, such as the gas mixing ratio, the DC-bias voltage, the RF power, and the process pressure. The maximum etch rate was obtained at 155.8 nm/min under a 15 mTorr process pressure, 700 W of RF power, and a BCl3 (6 sccm)/N2 (14 sccm) plasma. The highest etch selectivity was 1.9. We used X-ray photoelectron spectroscopy (XPS) to investigate the chemical reactions on the etched surface. Auger electron spectroscopy (AES) was used for the elemental analysis of the etched surfaces.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 22, 1 September 2010, Pages 6441–6445
نویسندگان
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