کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1669580 | 1008885 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Microstructural and textural characterization in MgO thin film using HRTEM
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
The microstructural and texture evolution of MgO protective films deposited on Si and glass substrates by ebeam evaporation were investigated. MgO films on both types of substrates consisted of a well developed columnar structure showing <111> texture in the cross sectional view and a triangle shape in the plane view. It was found that there is amorphous MgO between each columnar, which occupies 8–25% in the MgO films. The electron energy loss spectroscopy (EELS) spectrum of amorphous MgO showed features of chemical states and electronic structures different from those of crystalline MgO.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 14, 29 May 2009, Pages 3995–3998
Journal: Thin Solid Films - Volume 517, Issue 14, 29 May 2009, Pages 3995–3998
نویسندگان
Kyou-Hyun Kim, Min-Suk Lee, Jong-Seo Choi, Jae-Pyoung Ahn,