کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1669635 1008885 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Low energy O2+ and N2O+ ion beam modification of polyimide for improving adhesive strength of Cu/PI in roll-to-roll process
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Low energy O2+ and N2O+ ion beam modification of polyimide for improving adhesive strength of Cu/PI in roll-to-roll process
چکیده انگلیسی

To enhance the weak mechanical durability of directly deposited copper layers on polyimide (PI) film due to their poor adhesive strength, a continuous roll-to-roll process involving surface modification using a reactive ion beam irradiation and in-situ deposition process is studied. The polyimide film is modified by an ion source with a linear stationary plasma thruster (LSPT) in the vacuum roll-to-roll process. An O2 ion beam, with beam energy of 214 eV and beam current density of 0.78 mA/cm2, and N2O ion beam, with 220 eV and 0.69 mA/cm2, irradiate PI film in winding speed of 0.5 m/min. The surface energy increases from 38 mN/m for the pristine PI film to 80 mN/m after beam irradiation at an ion fluence of 3.5 × 1016 ions/s. After beam irradiation, a 10 nm thick tie layer and 200 nm thick copper layer are successively deposited by in-situ DC magnetron web coating. The peel strength of the copper layer on the PI film is enhanced from 0.4 kgf/cm without ion beam treatment to 0.71 kgf/cm after O2 beam treatment and to 0.75 kgf/cm after N2O beam treatment. This enhancement is closely related to the increase in the polar force originating from the formation of hydrophilic CO (carbonyl) groups on the modified PI surface.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 14, 29 May 2009, Pages 4222–4225
نویسندگان
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