کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1669683 1008887 2010 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Evolution of structure and properties of multi-component (AlCrTaTiZr)Ox films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Evolution of structure and properties of multi-component (AlCrTaTiZr)Ox films
چکیده انگلیسی

(AlCrTaTiZr)Ox films were deposited at 350 °C by DC magnetron sputtering from high-entropy alloy target. Oxygen concentration increases with oxygen flow ratio, and saturates near 67 at.%. As-deposited films have an amorphous structure. Their hardness fall in the range of 8–13 GPa. All amorphous oxide films maintain their amorphous structure up to 800 °C for at least 1 h. After 900 °C 5 h annealing, crystalline phases with the structures of ZrO2, TiO2, or Ti2ZrO6 form. Annealing enhances mechanical properties of the films. Their hardness and modulus attain to the values about 20 and 260 GPa, respectively. The resistivity of the metallic films is around 102 μΩ cm but drastically rises to 1012 μΩ cm when oxygen concentration increases.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 10, 1 March 2010, Pages 2732–2737
نویسندگان
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