کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1670082 1008895 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Double subband occupation of the two-dimensional electron gas in InxAl1 − xN/AlN/GaN/AlN heterostructures with a low indium content (0.064 ≤ x ≤ 0.140) barrier
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Double subband occupation of the two-dimensional electron gas in InxAl1 − xN/AlN/GaN/AlN heterostructures with a low indium content (0.064 ≤ x ≤ 0.140) barrier
چکیده انگلیسی
We present a carrier transport study on low indium content (0.064 ≤ x ≤ 0.140) InxAl1 − xN/AlN/GaN/AlN heterostructures. Experimental Hall data were carried out as a function of temperature (33-300 K) and a magnetic field (0-1.4 T). A two-dimensional electron gas (2DEG) with single or double subbands and a two-dimensional hole gas were extracted after implementing quantitative mobility spectrum analysis on the magnetic field dependent Hall data. The mobility of the lowest subband of 2DEG was found to be lower than the mobility of the second subband. This behavior is explained by way of interface related scattering mechanisms, and the results are supported with a one-dimensional self-consistent solution of non-linear Schrödinger-Poisson equations.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 19, 30 July 2010, Pages 5572-5575
نویسندگان
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