کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1670176 | 1008896 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes Enhanced lifetime in porous silicon light-emitting diodes with fluorine doped tin oxide electrodes](/preview/png/1670176.png)
چکیده انگلیسی
We investigated the electrical and optical properties of porous Si (PS) light-emitting diodes using fluorinated tin oxide (FTO) as transparent electrodes. At high forward bias, the current–voltage characteristic is space charge limited. At low forward bias, it follows an exponential law. Whereas the electroluminescence (EL) in devices with non-fluorinated indium–tin oxide electrodes degrades in few minutes, EL intensity in devices with FTO electrodes shows little degradation after 1300 min of operation. This result indicates that the well known beneficial effects of fluorinated species in the improvement of resistance to irradiation and carrier injection degradation in metal–oxide–semiconductor devices might be also observed in PS devices.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 2, 28 November 2008, Pages 870–873
Journal: Thin Solid Films - Volume 517, Issue 2, 28 November 2008, Pages 870–873
نویسندگان
Andréia G. Macedo, Elder A. de Vasconcelos, Rogério Valaski, Fábio Muchenski, Eronides F. da Silva Jr., Antônio F. da Silva, Lucimara S. Roman,