کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1670308 1008898 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Evidence of vacuum between buckled films and their substrates
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
Evidence of vacuum between buckled films and their substrates
چکیده انگلیسی

Closed-buckling structures have been opened by a focus ion beam process. Atomic force microscopy investigations prior to and after the opening have evidenced a significant increase of the maximum deflection of the buckling structures. These experimental results have been discussed in the framework of the Föppl–Von Karman theory of thin plates and are interpreted in terms of the existence of vacuum between the delaminated film and the substrate. The critical stress for buckling to occur is consequently modified taking into account this pressure mismatch.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 518, Issue 18, 1 July 2010, Pages 5233–5236
نویسندگان
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