کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1671614 | 1008920 | 2007 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Structure, conductivity, and optical absorption of Ag2âxO films
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Evaporation of Ag in the presence of an electron cyclotron resonance (ECR) oxygen plasma was used to deposit Ag2âxO films with a range of stoichiometries onto r-plane sapphire substrates. A quartz crystal oscillator (QCO) was used to accurately measure the silver and oxygen arrival rates and establish the O/Ag flux ratio needed to produce films with nominal Ag2O stoichiometry. X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) analysis indicates that the Ag2âxO films are not single phase but contain signatures of coexisting Ag2O and AgO components. XRD shows that the lattice matching with the r-plane sapphire substrate causes the Ag2O phase to grow with <002> heteroepitaxial crystallites coexisting with crystallites having <111> normal and random in-plane orientation. The AgO phase also forms with crystallites having <002> heteroepitaxy as well as crystallites with <111> normal and random in-plane orientation. The mixed phase Ag2âxO films exhibit approximately 77% optical transmission over the visible range (500 nm to 700 nm) and have a single absorption edge near 3.3 eV. Four-point van der Pauw conductivity and Hall effect measurements indicate that the Ag2âxO films are p-type with a conductivity on the order of 3 Ã 10â 3 Ωâ 1 cmâ 1.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 515, Issue 24, 15 October 2007, Pages 8684-8688
Journal: Thin Solid Films - Volume 515, Issue 24, 15 October 2007, Pages 8684-8688
نویسندگان
S.B. Rivers, G. Bernhardt, M.W. Wright, D.J. Frankel, M.M. Steeves, R.J. Lad,