کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1672018 1008927 2009 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
a-Si:H p–i–n structures with extreme i-layer thickness
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد فناوری نانو (نانو تکنولوژی)
پیش نمایش صفحه اول مقاله
a-Si:H p–i–n structures with extreme i-layer thickness
چکیده انگلیسی

We present measurements and numerical simulation of a-Si:H p–i–n detectors with a wide range of intrinsic layer thickness between 2 and 10 µm. Such a large active layer thickness is required in applications like elementary particle detectors or X-ray detectors. For large thickness and depending on the applied bias, we observe a sharp peak in the spectral response in the red region near 700 nm. Simulation results obtained with the program ASCA are in agreement with the measurement and permit the explanation of the experimental data. In thick samples holes recombine or are trapped before reaching the contacts, and the conduction mechanism is fully electron dominated. As a consequence, the peak position in the spectral response is located near the optical band gap of the a-Si:H i-layer.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Thin Solid Films - Volume 517, Issue 23, 1 October 2009, Pages 6426–6429
نویسندگان
, , , , ,