An attempt to measure simultaneously molecular orientation and current–voltage characteristics in thin films

To investigate the relationship between molecular orientation and current voltage (J–V) characteristics, molecular orientation and J–V characteristics have been simultaneously measured in some indium tin oxide (ITO)/X/Al structures. X were thin films fabricated from poly(3-hexylthiophene) (P3HT), coumarin6 dispersed in poly(N-vinylcarvazole), or biomolecular hemin (Hm). The results have shown that the orientation change of the P3HT chain causes a reproducible loop of the J–V characteristics in P3HT thin film, and that the peak observed in the J–V characteristics in Hm is associated with irreversible molecular orientation change.